top of page

The 14th International Conference on Beam Injection Assessment of Microstructures in Semiconductors

  • 작성자 사진: cpcl32903829
    cpcl32903829
  • 2018년 6월 22일
  • 1분 분량

2018년 6월 18일-6월 21일, 서울 코리아나 호텔에서 열린 The 14th International Conference on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2018)에 이건엽, 김수현, 최용하 학생이 참석하였습니다.

StartFragment

"Characterization Defects in Graphene for sensor Application" -poster presentation

"Observation of Thickness Change in Black Phosphorous Through Raman Spectroscopy" -oral presentation

"Multilayer Graphene Produced by Transfer-Free Direct Growth Method and Its Identification Using Raman Spectroscopy" -oral presentation

박사과정 김수현 학생이 BIAMS 2018학회 Best Oral Presentation Award을 수상하였습니다.

EndFragment

 
 
 

Comments


(08826) 서울특별시 관악구 관악로 1,  302 동 1015 호 
Tel. 02-880-1513
#1015, Second Engineering Building,  

School of Chemical and Biological Engineering,
Seoul National University

Gwanak-ro, Gwanak-gu, Seoul (08826) 
Republic of Korea

(TEL) +82-2-880-1513

bottom of page